ACIDS
Hydrochloric acid is usually an uncritical etching medium for photoresists. When etching with hydrofluoric acid, its permeability in photoresist layers must be taken into account. However, unbuffered or buffered hydrofluoric acid can be used for many etching processes without any problems if the photoresist layers are sufficiently thick or the etching times are short. Strongly oxidising acids such as HNO3-containing mixtures or etching mixtures of H2SO4 and H2O2 strongly attack photoresist. Thermal crosslinking of positive resists or the use of crosslinking negative resists can significantly increase the stability of the resist mask.
Further Information:
> Application areas and compatibilities
> Image Reversal Resist Processing
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