Skip to main content Skip to search Skip to main navigation
Menu

CZ-Si wafer 2 inch 279 um (100) SSP B-doped

Test CZ-Si wafer 279 µm 100

Description

Product information "CZ-Si wafer 2 inch 279 um (100) SSP B-doped"

Test CZ-Si wafer 2 inch, thickness = 279 ± 25 µm, (100), 1-side polished, p-type (Boron), 1 - 20 Ohm cm